About the Book
The original book
brings you in-depth coverage of the most vital microelectronic components of
digital components of digital logic system design that underlie semiconductor
memory. Keeping pace with the explosive growth in submicron development, the
author presents state-of –the-art information on semiconductor memory
technology for both volatile and nonvolatile memory devices, including testing
reliability issues, and radiation effects, Semiconductor
Memories provides in-depth coverage in the areas of design for testing fault
tolerance failure modes and mechanisms, as well as screening and qualification
methods. It offers will enhance your understanding of key topics such as:
· Memory cell structures and fabrication technologies
· Application-specific memories and architectures
· Memory design, fault modeling and test algorithms, limitations, and
trade-offs
· Space environment. Radiation hardening process and design techniques,
and radiation testing
· Memory stacks and multiply modules for gigabyte storage
In addition you’ll find through
coverage of recent advances in semiconductor memory devices as well as future
technology developments. This book will be valuable to all industry
professionals and students working with semiconductor memories, including those
in computing, automotive, military , and aerospace fields. |
Contents
Introduction, 2. Random Access Memory Technologies, 3. Nonvolatile Memories, 4. Memory Fault Modeling and Testing, 5. Memory Design for Testability and
Fault Tolerance, 6. Semiconductor
Memory Reliability, 7. Semiconductor
Memory Radiation Effects, 8.
Advanced Memory technologies, 9. High-Density
Memory Packing Technologies. |
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